Abstract:A femtosecond electron‐based versatile microscopy that combines scanning ultrafast electron microscopy imaging and time‐resolved cathodoluminescence detection allows for directly visualizing and decoupling complex carrier dynamics involved in surface and bulk of semiconductors with unprecedented spatiotemporal and energetic resolutions. Carrier dynamics detection in different dimensions (space, time, and energy) with high resolutions plays a pivotal role in the development of modern semiconductor devices, especially in low‐dimensional, high‐speed, and ultrasensitive devices. Here, a femtosecond electron‐based versatile microscopy is reported that combines scanning ultrafast electron microscopy (SUEM) imaging and time‐resolved cathodoluminescence (TRCL) detection, which allows for visualizing and decoupling different dynamic processes of carriers involved in surface and bulk in semiconductors with unprecedented spatiotemporal and energetic resolutions. The achieved spatial resolution is better than 10 nm, and the temporal resolutions for SUEM imaging and TRCL detection are ≈500 fs and ≈4.5 ps, respectively, representing state‐of‐the‐art performance. To demonstrate its unique capability, the surface and bulk carrier dynamics involved in n‐type gallium arsenide (GaAs) are directly tracked and distinguished. It is revealed, in real time and space, that hot carrier cooling, defect trapping, and interband‐/defect‐assisted radiative recombination in the energy domain result in ordinal super‐diffusion, localization, and sub‐diffusion of carriers at the surface, elucidating the crucial role of surface states on carrier dynamics. The study not only gives a comprehensive physical picture of carrier dynamics in GaAs, but also provides a powerful platform for exploring complex carrier dynamics in semiconductors for promoting their device performance.

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Simulation of P-N Junction Properties of Nanowires and Nanowire Arrays

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Ultrafast optical nanoscopy of carrier dynamics in silicon nanowires

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Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy

Unconventional Shrinkage of Hot Electron Distribution in Metal Directly Visualized by Ultrafast Imaging

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Photomodulated Rayleigh Scattering from Single Semiconductor Nanowires

Mapping Carrier Dynamics on Material Surfaces in Space and Time using Scanning Ultrafast Electron Microscopy

Visualizing hot carrier dynamics by nonlinear optical microscopy at the atomic length scale

Imaging ultrafast carrier transport in nanoscale devices using femtosecond photocurrent microscopy

Retrieving the Subwavelength Cross-Section of Dielectric Nanowires with Asymmetric Excitation of Bloch Surface Waves.

Real-Time Visualization of Solid-Phase Ion Migration Kinetics on Nanowire Monolayer.

Real-time Visualization of Convective Transportation of Solid Materials at Nanoscale.

Quantum gas-enabled direct mapping of active current density in percolating networks of nanowires

A Femtosecond Electron‐Based Versatile Microscopy for Visualizing Carrier Dynamics in Semiconductors Across Spatiotemporal and Energetic Domains

Nanoscale imaging of phonon dynamics by electron microscopy

Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors

Ultrafast carrier relaxation dynamics of photoexcited GaAs and GaAs/AlGaAs nanowire array

Simultaneous imaging of voltage and current density of flowing electrons in two dimensions