Optical and Electrical Properties of Polycrystalline Gan Films Prepared by Post-Nitridation Technique

YG Yang,Y Ke,YF Zhang
DOI: https://doi.org/10.1016/j.physb.2004.05.004
2004-01-01
Abstract:Gallium nitride (GaN) films with hexagonal structure were prepared by post-nitridation technique. XRD results indicate that the polycrystalline GaN with hexagonal structure was successfully grown on the Si (111) substrate. The photoluminescence spectra of the films show a strong UV emission at room temperature. The field emission property and Raman spectrum of GaN are also investigated.
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