The SCC-based Automatic Langmuir Probe Measuring System

Chen Zhu,Cheng Jian,Liu Hanfei
DOI: https://doi.org/10.3969/j.issn.1000-0380.2009.02.021
2009-01-01
Abstract:The implementing method of electrostatic probe measuring system based on single chip computer is introduced.The automatic measurement of I-V characteristics of electrostatic probe is realized by using MAX531 as the D/A conversion and the TLC1549 as the A/D conversion.The structural feature of the system is presented and the hardware configuration and software design are discussed in detail.The hardware design for MAX531 and TLC1549,and the interfacing circuits with single chip computer are described emphatically;relevant reference program is given.Having been combined with the technology of anti-interference,the system offers high reliability;the data are collected quickly and accurately.The system has obtained excellent effects in practical applications.
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