Abstract:The application of digital circuits has gone deep into various aspects of daily lives and productions. Nowadays,digital systems are becoming more and more complex,which increase the complexity and difficulty of testing the digital circuits.As an important and effective method,automatic test of digital circuits has been extensively studied for testing complex digital circuits.Therefore,we propose an automatic digital circuit test system based on the Universal Serial Bus(USB)and the General Purpose Interface Bus(GPIB)in this paper.The design of the automatic test system can be divided into two parts:the hardware and the software.The hardware of the system includes computer,GPIB converter,USB digital I/O modules and test machines with GPIB interface.Buses are the medium of information transmission between the computer and other equipment.Owing to the widely use of USB and GPIB,we select USB and GPIB to connect all the modules of the hardware.The computer is the core of the hard-ware,which controls the I/O module and the test machines with GPIB interface via the USB interface.The computer also plays the role of processing the current test data and displaying the result of the test.Software of the system is based on LabVIEW and developed in the form of graphic program.With LabVIEW,we can quickly create the software front panel and call the hardware modules in need.The software consists of applications and database. Structure of the applications can be described as “major module+functional plugs”.Content of the major module is fixed while content of the function plugs is flexible.The applications contain the major part of the automatic test system,not j ust functional test module of the digital circuits,but also the fault isolation module and etc.The applications rely on the database.Microsoft Access is selected to work as the database software.The actual working process of the system is also introduced in this paper besides the hardware and software.Generation of the testing vectors is essential for the process.As a result,two common generation test algorithms are emphasized.The automatic test system has been applied to debug digital circuits of the radar receiver system.

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