Magnetic Anisotropy in (tb0.3dy0.7)45fe55 Amorphous Films

HB Xu,CB Jiang,XY Jiang,SK Gong
DOI: https://doi.org/10.1016/s0304-8853(01)00167-6
IF: 3.097
2001-01-01
Journal of Magnetism and Magnetic Materials
Abstract:Giant magnetostrictive (Tb0.3Dy0.7)45Fe55 thin films were prepared by direct current (DC) magnetron sputtering. The onset temperature of crystallization of the films is found to be 407°C through differential scanning calorimetery (DSC) studies. X-ray diffraction analysis confirms that the films exhibit an amorphous phase after annealing at 400°C. The effect of annealing on the in-plane anisotropy was investigated. The in-plane anisotropy is enhanced upon increasing the annealing temperature from 200°C to 400°C. The ratio Mr/M10 is varied from 0.037 for the as-deposited sample to 0.543 after annealing at 400°C, where Mr and M10 refer to remanence and magnetization measured at the field of 10kOe, respectively. In addition, pre-stress was also applied during deposition to induce an in-plane unidirectional anisotropy in the films. This may result in an anisotropy of the in-plane magnetization and lead to a large improvement of magnetostriction.
What problem does this paper attempt to address?