Abstract:enough. However, the complications associated with IP from different sources, having incompatible test strategies and requiring several types of testers, make a difficult situation nearly impossible. The answer is to build at least some of the test hardware on-chip. Ideally, a DFT technology should scale to larger devices so that common test approaches can be used across several designs. Test hardware can be straightforward IEEE 1149.1 scan logic or complex and application-specific, built-in self-test (BIST) circuitry. When the DUT is placed in a special test mode, scan logic reconfigures a device's latches into serial shift registers. Predetermined test vectors then can be shifted into the DUT, a test executed, and the test results shifted out for analysis. BIST may use the same 1149.1 test access port (TAP) pins for control, but vector generation and analysis are provided on-chip by the BIST test circuitry. Different BIST schemes are appropriate for logic, memory, and some special functions such as analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) and phase-locked loops (PLLs). A New design tools make it easy to include the right level of DFT with minimal overhead. Courtesy of Teradyne ntil recently, design for testability (DFT) had almost perfectly exemplified the conjunction of incongruous or contradictory terms: it was an oxymoron. Semiconductor companies acknowledged that they ranked DFT with unsettling concepts such as qualified success and deafening silence, but designing in testability always had been difficult. Consequently, manufacturers often solved the problem of reconciling design and test by avoiding it. The fact that the situation has changed is as remarkable as the cause. For many years, larger and faster ICs required larger and faster and more expensive ATE. The growth of the system on a chip (SOC) business has leapfrogged any possibility of continuing to follow this established test paradigm. Instead of IC size simply increasing each year by perhaps a million gates and a few more pins, SOCs today may integrate as many as 30 to 60 different intellectual property (IP) cores on a single chip. And, SOCs ignore the traditional segregation of memory, logic, and analog functions. Being faced with the need to test the very large chips that result from such an IP combination is bad

DFT for IP Cores Based on Deterministic-BIST

An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

At-Speed Logic BIST for IP Cores

Partition-based Low Power DFT Methodology for System-on-chips

A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

A Multi-frequency BIST IP Core with Scan Chain for Embedded Register File

Design of Phase Shifter for Logic BIST

Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture

Software- Based Self-Testing Methodology for Embedded Processor Cores

Hybrid BIST for system-on-a-chip using an embedded FPGA core

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

A Case Study of Testing Strategy for AI SoC

Design for Testability Design Test Test Development Failure Diagnosis the Multiple Facets of Dft Figure 1. Closing the Dft Gap

Design and Implementation of DFT Strategy in ASIC Design of Resilient Packet Ring

Scan BIST with Biased Scan Test Signals

Low power deterministic BIST based on SDIC

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST

Research on DFT of Digital Circuits Based on IEEE 1149.1 and Based on IEEE 1500

DFT Architecture for Click-Based Bundled-Data Asynchronous Circuits

Fingerprinting Methods for Intellectual Property Protection Using Constraints in Circuit Partitioning