Ultrahigh-Bandwidth Wdm Signal Integrity in Silicon-On-Insulator Nanowire Waveguides

Benjamin G. Lee,Xiaogang Chen,Aleksandr Biberman,Xiaoping Liu,I-Wei Hsieh,Cheng-Yun Chou,Jerry Dadap,Richard M. Osgood,Keren Bergman,Fengnian Xia,William Green,Lidija Sekaric,Yurii Vlasov
DOI: https://doi.org/10.1109/leos.2007.4382484
2007-01-01
Abstract:We measure signal degradation from interchannel crosstalk of ultrahigh-bandwidth signals in silicon-on-insulator waveguides, and single-channel power penalty over a range of injection powers. The results validate the suitability of silicon-based nanowire interconnects for broadband WDM networks.
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