Development of Simple Temperature Heating Station of D8 X-ray Diffractometer

WANG Da-hai,GAO Yuan-peng,LUO Huan
2013-01-01
Abstract:A simples,variable temperature heating unit has been successfully developed,which be quickly and easily installed on the X-ray diffractometer,without any replacement of D8 X-ray diffractometer attachment cases.In situ variable temperature X-ray diffraction test,meeting the demand from room temperature to 600 ℃ in-situ temperature X-ray diffraction test can be carried out,shortening the time of replacement of the attachment from 2~3 days to 30 min.The test efficiency is improve.A fund of nearly 20 million has been saved from the purchase of a similar variable temperature heating device.
What problem does this paper attempt to address?