Influences of crystallizing status of precursor Fe films on microstructure and properties of FeS2 films

Xubo Chen,Yanhui Liu,Yang Wang,Liang Meng
2008-01-01
Abstract:The precursor Fe films deposited at different substrate temperature were annealed at 400°C for 20 h in sulfur atmosphere to prepare FeS2 thin films. The effects of crystallizing status of the precursor Fe films on the microstructure and electrical properties of FeS2 films were investigated. Higher substrate temperature results in larger crystallite scale of the precursor Fe films. Sulfuration reaction at 400°C induces the change of precursor Fe with various crystallizing levels into fine FeS2 crystallites. With the increase of substrate temperature in depositing the precursor Fe films, the geometrical completeness of the film bulk increases, the carrier concentration decreases and the Hall mobility increases for the FeS2 films formed from the precursor Fe films. The electrical resistivity shows a maximum when the FeS2 films are obtained from the precursor Fe films deposited at substrate temperatures in 300-400°C. The mechanism that different substrate temperature changes the crystallizing status of the precursor Fe films and results finally in various behaviors of crystal lattice defects and levels of phase transformation stress in the FeS2 films should be responsible for the change of electrical properties with substrate temperature.
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