Synthesis and characterization of phase change memory cells

Ke Wang,XiaoDong Han,Ze Zhang,LiangCai Wu,Bo Liu,ZhiTang Song,SongLin Feng
DOI: https://doi.org/10.1007/s11431-009-0200-7
2009-01-01
Science in China Series E: Technological Sciences
Abstract:Phase change memory (PCM) cells based on Ge 2 Sb 2 Te 5 were synthesized and investigated. Current-voltage measurements demonstrated different final resistances. Transmission electron microscopy (TEM), high resolution electron microscopy (HREM) and the energy dispersive X-ray spectroscopy (EDS) analyses were used to characterize the microstructures of the PCM cells. The architectures, structures and defects in the cells including the deposited elemental distributions and the interfacial structures between electrodes and barrier layers were studied in detail.
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