SEEBECK COEFFICIENT AND ELECTRICAL RESISTIVITY OF SILICON

Zhao Wei,Hou Qingrun,Chen Yibao,He Yuanjin
DOI: https://doi.org/10.3969/j.issn.1009-7104.2007.01.006
2007-01-01
Abstract:The experimental method and results of measuring the Seebeck coefficient and electric resistivity of semiconductor silicon are introduced. Similar to the measurement of Hall coefficient, some conduction properties of silicon could be understood from Seebeck coefficient in another perspective. The charged carriers could be distinguished to be P-type or N-type according to the sign of the Seebeck coefficient. Two conduction mechanisms, impurity conduction and intrinsic conduction, are found in semiconductor. The lattice scattering factor in the impurity conduction region and the forbidden band width of silicon in intrinsic conduction region could be determined.
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