Voltage and temperature dependence of the grain boundary tunneling magnetoresistance in manganites
C. Höfener,J. B. Philipp,J. Klein,L. Alff,A. Marx,B. Büchner,R. Gross,C Höfener,J. B Philipp,J Klein,L Alff,A Marx,B Büchner,R Gross
DOI: https://doi.org/10.1209/epl/i2000-00324-1
2000-06-01
Europhysics Letters (EPL)
Abstract:We have performed a systematic analysis of the voltage and temperature dependence of the tunneling magnetoresistance (TMR) of grain boundaries (GB) in the manganites. We find a strong decrease of the TMR with increasing voltage and temperature. The decrease of the TMR with increasing voltage scales with an increase of the inelastic tunneling current due to multi-step inelastic tunneling via localized defect states in the tunneling barrier. This behavior can be described within a three-current model for magnetic tunnel junctions that extends the two-current Jullière model by adding an inelastic, spin-independent tunneling contribution. Our analysis gives strong evidence that the observed drastic decrease of the GB-TMR in manganites is caused by an imperfect tunneling barrier.