Measurement of Refractive Index of the Optical Crystal with Spectrophotometer

TAN Tian-ya,YI Kui,SHAO Jian-da,FAN Zheng-xiu
DOI: https://doi.org/10.3321/j.issn:0258-7025.2005.12.019
2005-01-01
Chinese Journal of Lasers
Abstract:Design of thin film devices on the crystal is based on the accurate determination of crystal refractive index.Methods for measuring the refractive indices of crystals with spectrophotometer are introduced in this paper.The backside reflection effect is elimilated by means of backside influence coefficient,AR(antireflection) coating on backside,and combination of the former two when measuring the reflectance of the crystal.Specific steps are given and measurement errors are analyzed.The reflectance or transmittance change with propagation direction can be obtained using polarizer scanning due to the optical anisotropy of the crystal.The feasibility of the methods introduced is proved by measuring the refractive index of LiB_3O_5 crystal plate,and showing that the methods are used for measurement of the optical crystals.
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