Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer
Heesu Lee,Seungjin Hwang,Hong Jin Kong,Kyung Hee Hong,Tae Jun Yu
DOI: https://doi.org/10.3390/s24010017
IF: 3.9
2023-12-20
Sensors
Abstract:In this study, we simultaneously measured the group refractive index dispersion and thickness of fused silica using a scanning white light interferometer on a spectral range from 800 to 1050 nm. A delay error correction was performed using a He-Ne laser. The accuracy of the measured group refractive index dispersion of fused silica, when compared to the temperature-dependent Sellmeier equation, is within 4 × 10−5.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation