Refraction Index Measurement of Transparent Materials by Using Diffraction Grating and CCD

邓广安,蔡志岗,张运华,徐宇科,吴水珠,周建英
DOI: https://doi.org/10.3321/j.issn:0253-2239.2004.01.022
2004-01-01
Abstract:A bs t r a c t : An e xp e rime ntal met hod f or t he ref raction inde x meas ure me nt of t rans p a re nt mat e rials is desc ribed , based on t he int e rf e re nce of e x p anded and collimat ed lase r beams t hat a re diff ract ed b y a gratin g . The int e rf e re nce p at t e r n is cap t ured by a CCD came ra , and p rocessed wit h a home2made sof t wa re . The op tical a r ran ge me nt is simple and eas y t o manip ulat e . The p recision of t he ref raction inde x meas ure me nt is of t he orde r of 10 - 4 . Two ways have bee n p rovided t o ca r r y out t he meas ure me nts , t he second see ms t o be bet t e r in our case , and t he an gle meas ure me nt accurac y is more imp ortant t han f rin ge move me nt p ositionin g . Its application t o isot ropic p ol yme ric t hin film is also p rese nt ed. Key w o r ds : op tical meas ure me nt ; int e rf e re nce and diff raction ; ref raction inde x ; diff raction gratin g ; CCD ; t ransp a re nt mat e rial
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