Abstract:The refractive index (RI), an important optical property of a material, is measured by commercial refractometers in the food, agricultural, chemical, and manufacturing industries. Most of these refractometers must be equipped with a prism for light dispersion, which drastically limits the design and size of the refractometer. Recently, there have been several reports on the development of a surface plasmon resonance (SPR)-based RI detector, which is characterized by its high sensitivity and simplicity. However, regardless of the prism, an expensive spectrometer is required to analyze the resonance wavelength or angle of incidence. This paper proposes a method that eliminates the need for the prism and other conventional spectrometer components. For this purpose, total internal reflection SPR technology was used on an Ag thin film, and RI analysis was combined with a lens-free CMOS image sensor or a smartphone camera. A finite-difference time-domain (FDTD) numerical simulation was performed to evaluate the relationship between the output power intensity and Ag film thickness for different RIs at three wavelengths of commercial light-emitting diodes (LEDs). The maximum sensitivity of -824.54 RIU-1 was achieved with AG20 at an incident wavelength of 559 nm. Due to its simple design and cost effectiveness, this prism-less, SPR-based refractometer combined with a lens-free CMOS image sensor or a smartphone could be a superior candidate for a point-of-care device that can determine the RIs of various analytes in the field of biological or chemical sensing.

Determination of zero incident angle by optical feedback effect and its applications in the measurement of refractive indices

Small angle measurement method based on the total internal multi-reflection

Measurement of the Group Refractive Index of Bulk Material Using White-Light Spectral Interferometry

Polarization interference interrogation of angular surface plasmon resonance sensors with wide metal film thickness tolerance

Optical refractometry using lensless holography and autofocusing.

Integrated uncertainty of refractive index measured by using a prism at non-minimum deviation angle

Refractive Index Measurement of Liquids by Double-Beam Laser Frequency-Shift Feedback

Precise Refractive Index Measurement of Fused Silica Optics

Applicability of the Focusing Method to Measure the Refractive Index Profile of Polymer Optical Fibers

Resolving the Refractive Indices of Transparent and Translucent Liquids from the Spacings, Spatial Frequencies, and Directions of Interference Fringes

The Study of Refractive Index Measurement Based on the Self-Mixing Interference in Laser Diode

Refractive Index and Dispersion Measurement Principle with Polarization Change in Total Internal Reflection

Improving the Measurement Accuracy of Refractive Index of GaAs and Sapphire Crystal by Laser Feedback Interferometry

A Simple Optical Procedure for Characterizing Uniaxial Media

Output Intensity Variations of the Laser Used in a Prism Coupling System and Its Application

Fiber-Optic Refractometer Based on a Reflective Aspheric Prism Rendering Adjustable Sensitivity

High-accuracy Measurement of Air Refractive Index Using Two Frequency-Doubling Crystals

New Design to Measure Absolute Spectral Reflectivity

A CMOS Image Sensor Based Refractometer without Spectrometry

Thickness and refractive-index measurement of birefringent material by laser feedback technique.