Theoretical analysis and measurements on near specular scattering

Haiming Wang
DOI: https://doi.org/10.1016/S0143-8166(96)00024-3
IF: 5.666
1997-01-01
Optics and Lasers in Engineering
Abstract:In scattering measurement it is important and also difficult to separate instrument scattering from the scattering of a sample. Particularly at angles near the specular reflection, it is believed that the small angle limit for scattering measurement is determined not only by detector proximity to the specular beam, but also by the sample scattering. When the scattering angles are smaller than a certain limit, the total scattering combining the instrument scattering and the sample scattering is lower than the instrument scattering. This prevents us from discriminating the instrument scattering and the sample scattering at angles smaller than this limit. In this paper a data processing method is reported that enables us to distinguish the instrument scattering at angles smaller than this limit. Based on this method, we can measure the scattering at angles restricted only by the performance of the instrument.
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