Progress in High-Speed Atomic Force Microscopy

ZHAO Jian-yong,CAI Wei,SHANG Guang-yi
DOI: https://doi.org/10.3969/j.1000-6281.2013.01.014
2013-01-01
Abstract:Atomic force microscope(AFM) has become an important tool in the fields of material,biology and nano-science since it was invented in 1986.AFM provides a three-dimensional surface profile of insulating objects with atomic spatial resolution in atmosphere,liquid as well as vacuum.However,AFM imaging is slow and thus limited to observe quasi-static process.Recently,high speed atomic force microscopy(HSAFM) has been paid considerable attention for its potential applications in the study of biological dynamic process,in-situ measurement in industrial product line and ultra-high density storage.Centering on it,some researchers have done a lot of work making significant development in key technologies for improving the imaging speed of AFM and applications exploration.The author’s laboratory has also worked on HSAFM and got initial achievement.In the paper,recent progresses in key techniques of HSAFM including small cantilever,high speed scanner and control methods are reviewed,and its applications are briefly described.
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