A Review of Atomic force Microscopy Applied in Nanoscience

Liangyun Yu,Qi Zhang,Shujun Yuan
DOI: https://doi.org/10.3969/j.issn.1008-021X.2016.24.015
2016-01-01
Abstract:Atomic force microscopy (AFM)has been more and more widely used in nanoscience owing to its simple operation, not strict requirements of the samples,the ability to detect insulating samples,and atomic resolution. This paper briefly introduced the ultimate principle of AFM,and put emphasis on the research progress of three aspects including the observation of the appearance features of nano- materials,the mechanical analysis,and the nano-materials processing.
What problem does this paper attempt to address?