Application Progress of Atomic Force Microscope to Polymer Science

DONG Yan-ming,BI Dan-xia,CHEN Jiang-xi
DOI: https://doi.org/10.3969/j.issn.1672-3600.2005.02.002
2005-01-01
Abstract:Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope(STM)and has extensive application in polymer field. AFM allows not only visualization of surface morphology and investigation of mechanical properties, but also nanoindentation and modification without any special sample treatment. This paper reviews some recent advances and new techniques of the application of AFM to polymer science.
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