The Microstructure of Β-Sic Whiskers

Y YAN,J CHEN,LC WANG,Q LI,D FENG,L CAO,CK YAO
DOI: https://doi.org/10.1016/0167-577x(89)90172-9
IF: 3
1989-01-01
Materials Letters
Abstract:The microstructure of β-SiC whiskers was identified and analyzed by high-resolution electron microscopy (HREM). The whiskers are characterized by one-dimensionally disordered structure. HREM shows that there is a high density of stacking faults and microtwins lying on the close-packed plane perpendicular to the whisker axis. The different types of stacking faults can be distinguished with HREM imaging.
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