Microscopic Structure of Metal Whiskers

Vamsi Borra,Daniel G. Georgiev,V. G. Karpov,Diana Shvydka,V. G. Karpov
DOI: https://doi.org/10.1103/physrevapplied.9.054029
IF: 4.6
2018-05-21
Physical Review Applied
Abstract:We present TEM images of the interior of metal whiskers (MWs) grown on electroplated Sn films. Along with earlier published information, our observations focus on a number of questions, such as, why MWs’ diameters are in the micron range (significantly exceeding the typical nanosizes of nuclei in solids), why the diameters remain practically unchanged in the course of MW growth, what the nature of MW diameter stochasticity is, and what the origin of the well-known striation structure of MW side surfaces is. In an attempt to address such questions, we perform an in-depth study of MW structure at the nanoscale by detaching a MW from its original film, reducing its size to a thin slice by cutting its sides by a focused ion beam, and performing TEM on that structure. Also, we examine the root of the MW and Cu-Sn interface for the intermetallic compounds. Our TEM observations reveal a rich nontrivial morphology suggesting that MWs may consist of many side-by-side grown filaments. This structure appears to extend to the outside whisker surface and be the reason for the striation. In addition, we put forward a theory where nucleation of multiple thin metal needles results in micron-scale and larger MW diameters. This theory is developed in the average field approximation similar to the roughening transitions of metal surfaces. The theory also predicts MW nucleation barriers and other observed features.
physics, applied
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