Abstract:Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In-operando characterization of such devices by scanned probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanned probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically-biased graphene FET device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

Response-table-based virtual responding method and instrument and their applications in scanning probe microscopes

Cavity Beam Position Monitor Test System Based on Virtual Instrument

Design of Optimal Fast Scanning Trajectory for the Mechanical Scanner of Measurement Instruments

Soft Control of Scanning Probe Microscope with High Flexibility.

Scanning Probe Microscope Controlled by Single Personal Computer with Linux

RTSPM: Real-time Linux control software for scanning probe microscopy

A real-time software simulator for scanning force microscopy

Probe Experimental Mechanics

A Miniature Electric Probe with a High Spatial Resolution

Probe Design and Source Reconstruction for Near-Field Scanning and Modeling

SEM Image-Based 3-D Nanomanipulation Information Extraction and Closed-Loop Probe Control

A versatile LabVIEW and FPGA-based scanned probe microscope for in-operando electronic device characterization

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

Dynamic Error Modeling and Compensation of a Scanning Probe on CMM

Modeling a radio-frequency single-electron-transistor scanning probe

An Alternative Flat Scanner and Micropositioning Method for Scanning Probe Microscope

Research of the key techniques of designing a virtual digital signal processing instrument

Control technologies for scanning probe microscope-a review

A Collision Response Method in Virtual Environment of Peg-in-hole Microassembly

Characterization of qPlus probe for atomic force microscopy using scanning electron microscopy

Design and Verification of Micro/Nano-Probes for Coordinate Measuring Machines