Influence of O2/Ar Ratio on the Structural, Electrical, and Optical Properties of Transparent Conductive Zirconium-Doped ZnO Films Prepared by Radiofrequency Sputtering

Feng Cao,Yiding Wang,Lei Li,Baojia Guo,Yupeng An
DOI: https://doi.org/10.1016/j.scriptamat.2009.03.036
IF: 6.302
2009-01-01
Scripta Materialia
Abstract:Zirconium-doped ZnO (ZZO) transparent conductive films are deposited on glass substrates by radiofrequency sputtering at 300 degrees C. The influence of O-2/Ar ratio on the structural, electrical and optical properties of ZZO films is investigated by X-ray diffraction, Hall measurement, and optical transmission spectroscopy. The results show that ZZO thin films are polycrystalline with a preferred (002) orientation. The lowest resistivity of 3.7 x 10(-4) Omega cm is obtained at the O-2/Ar ratio of 1/12. The average optical transmittance of the films is over 90%, and the transmittance has no evident change with increasing O-2/Ar ratio. (C) 2009 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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