Optical Properties of Silver Thin Films, Derived from REELS

Z. M. Zhang,T. Chen,Z. J. Ding,T. Tang,A. Csik,J. Toth,K. Tokesi
DOI: https://doi.org/10.1002/sia.3312
2010-01-01
Surface and Interface Analysis
Abstract:The differential surface excitation probabilities (DSEPs) for medium-energy electrons traveling in Ag are extracted from reflection electron energy loss spectroscopy (REELS) spectra by using the Werner's elimination-retrieved algorithm. Based on a surface Kramers-Kronig dispersion relationship, the electronic structure and optical properties of Ag thin film are determined. The results show that the optical property curves between surface thin layer and bulk are similar in shape, whereas they deviate quantitatively for energies below 40 eV, which may be caused by the different electronic structures at surface and in bulk. The present data would be an appropriate approximation to the optical properties of thin film, whose thickness is characterized by the inelastic mean free path of the electrons in a REELS experiment. Copyright (C) 2010 John Wiley & Sons, Ltd.
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