Abstract:The surface excitation effect is investigated by using the quantum mechanical frame work of complex self-energy of electrons which interact with a bounded semi-infinite medium. In the self-energy formalism, differential inverse inelastic mean free path (DIIMFP) has contributions from bulk and surface plasmons. Monte Carlo simulation of the interaction of electrons with a solid medium and surface has been performed. The surface excitation parameter (SEP) is then obtained from the simulated reflection electron energy loss spectroscopy (REELS) spectra. The calculated SEP results by Monte Carlo simulation are compared with the previous calculations of total surface excitation probability, which was estimated by a numerical integration of surface term of DIIMFP. The contribution merely due to surface excitations towards REELS spectra is extracted by subtracting the two Monte Carlo simulated REELS spectra that based on the two models of electron inelastic scattering, i.e. a full surface model (SM) and a pure bulk model (BM). The surface excitations found to be significant at low energy losses and diminish at higher energy losses whereas the bulk plasmon contributions show opposite behavior and are negligible at lower energy losses. The average number of surface excitations is then evaluated by the computation of ratio of the integrated surface contribution to the elastic peak. The calculated results for Ag are found to be reasonably in agreement with our previous results for total probability of surface excitations and other reported experimental data for SEP. Surface correction factor (SCF) is calculated using SEP for several metals and is compared with the reported ratio of SCF with Ni sample as reference.

Method for A Quick Estimation of Energy Dependent Reflection Electron Energy Loss Spectroscopy Spectra for Al and Si

Effective Energy Loss Function of Silver Derived from Reflection Electron Energy Loss Spectra

Determination of the Energy Loss Function of Tungsten from Reflection Electron Energy Loss Spectroscopy Spectra

Derivation of new energy-loss functions as applied to analysis of Si 2p XPS spectra

ENERGY-LOSS FUNCTIONS DERIVED FROM REELS SPECTRA FOR ALUMINUM

Optical Properties of Silicon and Germanium Determined by High-Precision Analysis of Reflection Electron Energy Loss Spectroscopy Spectra

Monte Carlo Simulation Study Of Reflection-Electron-Energy-Loss-Spectroscopy Spectrum

Revision of Optical Property of Silicon by a Reverse Monte Carlo Analysis of Reflection Electron Energy Loss Spectroscopy Spectra

Absolute Determination of Optical Constants by Reflection Electron Energy Loss Spectroscopy

A Cylindrical Lens Spectrometer with Parallel Detection for Reflection Electron Energy Loss Spectroscopy

A Reverse Monte Carlo Method for Deriving Optical Constants of Solids from Reflection Electron Energy-Loss Spectroscopy Spectra

Individual Separation of Surface, Bulk and Begrenzungs Effect Components in the Surface Electron Energy Spectra

A New Analytical Method In Surface Electron Spectroscopy: Reverse Monte Carlo Method

Monte Carlo Simulation Study of Reflection Electron Energy Loss Spectroscopy of an Fe/Si Overlayer Sample

Quantification of Surface Effects: Monte Carlo Simulation of REELS Spectra to Obtain Surface Excitation Parameter

Calculations of Energy-Loss Function for 26 Materials

Calculation of Electron-Surface Inelastic Interaction Cross-Section and Monte Carlo Simulation of Surface Excitation

Deriving Effective Energy Loss Function for Silver from Xps Spectrum

Absolute Determination of Optical Constants of Three Transition Metals Using Reflection Electron Energy Loss Spectroscopy

Revision of Optical Properties of Solids Based on the Reverse Monte Carlo Analysis of Reflection Electron Energy Loss Spectroscopy Spectra

Monte Carlo Calculation of Electron Rutherford Backscattering Spectra and High-Energy Reflection Electron Energy Loss Spectra