Research on Lamellar Structure and Microhardness in Directionally Solidified Ternary Sn–40.5Pb–2.6Sb Eutectic Alloy

X. W. Hu,S. M. Li,S. F. Gao,L. Liu,H. Z. Fu
DOI: https://doi.org/10.1016/j.jallcom.2009.12.086
IF: 6.2
2010-01-01
Journal of Alloys and Compounds
Abstract:Sn–40.5wt%Pb–2.6wt%Sb ternary alloy was directionally solidified with a constant temperature gradient (G=18K/mm) and growth rates ranging from 1μm/s to 30μm/s. Experimental results indicated that the lamellar structure consisted of Pb-rich and Sn-rich phases. The lamellar spacings (λ) and microhardness (HV) were measured and the HV increased with increasing growth rate (V) or decreased with increasing lamellar spacing. The dependences of λ and HV on V were determined by using a linear regression analysis. The relationships between the λ, V and HV were given as: λ=3.39V−0.51, HV=12.65V0.11 and HV=16.42λ−0.2, respectively. The fitted exponent values were in accordance with the previous experimental results obtained from Sn–Pb alloys and In–Bi–Sn ternary alloys.
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