A Study of the Microstructure of Epitaxial Heterostructures of YBa2Cu3O7 and PrBa2Cu3O7

CL JIA,B KABIUS,H SOLTNER,U POPPE,J SCHUBERT,K URBAN
DOI: https://doi.org/10.1016/0921-4534(90)90661-w
1990-01-01
Abstract:Multilayers with a sequence of YBa2Cu3O7/PrBa2Cu3O7/YBa2Cu3O7 have been sputtered epitaxially on [001] SrTiO3 substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.
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