Abstract:Thermodynamic behavior investigations on nanomaterials are of great scientific interest and possess technological implications for advancing nanoscience and nanotechnology. However, nanoscale thermodynamic studies on ceramic semiconductors are faced with great challenges due to their thermostability, and there lacks a percipient understanding of their atomistic thermal behaviors. Here, the atomic‐scale mechanism of the melting and coalescence processes of binary semiconductors, including rutile TiO2(R) and SnSe nanostructures, via real‐time electron beam (e‐beam) irradiation is reported. Under the e‐beam, the inelastic electron‐matter interactions and the low thermal conductivity of the samples cause a local temperature increase. The in situ melting process is recorded via high‐resolution TEM imaging, which exclusively shows a specific planar melting order of the (001), (011), and (100) for TiO2(R). This measurement provides direct evidence that matches the surface energy differences predicted by existing theoretical calculations and experiments. A similar phenomenon is induced and observed on SnSe, which derives a particular melting order of (210), (211), and (002). Furthermore, the in situ melting and coalescence analysis of ultrafine TiO2(R) nanoparticles suggests surface atom transfer and recrystallization as observed. The demonstration of e‐beam directed shape formation and tailoring reveals the possibility for nano/microscale processing of ceramic nanostructures, which are otherwise considered chemically stable and mechanically robust.

Investigation of Tin Penetration at Bottom Surface of Float Borosilicate Glasses

Atomic Investigation on the Facet‐Dependent Melting of Ceramic Nanostructures Via in Situ Electron Irradiation

Simulation of Tin Penetration in the Float Glass Process (float Glass Tin Penetration)

Simulation of Tin Penetration Process in the Surface Layer of Soda-Lime-Silica Float Glass

Study on Immersion Tin Process by Electrochemical Methods and Molecular Orbital Theory

Investigating sulfur valence depth profile on float glass surfaces using electron probe microanalysis and stepwise etching

Microstructural and Functional Stability of Large-Scale SnO2:F Thin Film with Micro-Nano Structure

Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation

Surface wettability of the microporous ceramic tube and measurement of its porosity

Structure and Positron Annihilation Spectra of Tin Incorporated in Mesoporous Molecular Sieves

Effects of High-Temperature Treatment on the Reaction Between Sn-3%Ag-0.5%Cu Solder and Sputtered Ni-V Film on Ferrite Substrate

In Situ Optical Characterizations of the Annealing Effects Upon Sno2: F Films by Spectroscopic Ellipsometry

An Investigation of the Local Environments of Tin in Tin-Doped Α-Fe2o3

Properties of Nanosized Tin Oxide Thin Film Prepared by Reactive Magnetron Sputtering

Hydrothermal Preparation and Characterization of Nanocrystalline Porous Tin Dioxide Thin Films

Physical-Chemical Properties of Low-Melting Phosphate Glasses in Relation to Tin Oxide Content

Investigation On Structural, Electrical And Optical Properties Of Tungsten-Doped Tin Oxide Thin Films

Diffusion behaviors of Sn dopant in ITO films upon supercritical CO 2 treatment and annealing

Determination of trace tin by solid substrate-room temperature phosphorimetry using sodium dodecyl sulfate as sensitizer.

Effect of Tin Addition on Mesoporous Silica Thin Film and Its Application for Surface Photovoltage NO2 Gas Sensor.

Preparation and Characterization of P-Type Semiconducting Tin Oxide Thin Film Gas Sensors