Electrical Properties of CuGaTe2 Thin Films

M. Sesha Reddy,K. T. Ramakrishna Reddy,P. Jayarama Reddy
DOI: https://doi.org/10.1016/0254-0584(96)80070-8
IF: 4.778
1996-01-01
Materials Chemistry and Physics
Abstract:CuGaTe2 thin films were prepared by the flash evaporation technique. The influence of substrate temperature (Ts) on the electrical characteristics was studied. The films formed at Ts = 523–573 K were polycrystalline, single phase and nearly stoichiometric. The films of 0.7 μm thickness showed an electrical resistivity of about 10−2 Ω cm, a mobility of 55 cm2 V−1 s−1 with a carrier concentration of 1.5 × 1019 cm−3. The electrical resistivity was found to decrease with film thickness, whereas the mobility increased. The activation energies were also determined in the temperature range 300–575 K.
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