Optical constants of polycrystalline CuGaTe2 films

M. Sesha Reddy,K.T. Ramakrishna Reddy,B.S. Naidu,P.J. Reddy
DOI: https://doi.org/10.1016/0925-3467(95)00039-9
IF: 3.754
1995-01-01
Optical Materials
Abstract:Thin films of CuGaTe2 with thicknesses in the range, 0.1–1.0 μm were deposited on Corning 7059 glass substrates by flash evaporation. The substrate temperatures, Ts, were maintained in the range 373–623 K. The transmittance of the films was recorded in the wavelength range 900–2500 nm. The dependence of the optical band gap, Eg, on substrate temperature showed that the value of Eg varied from 1.21 eV to 1.24 eV. The variation of refractive index and extinction coefficient with photon energy was studied from which the material properties such as the limiting value of dielectric constant, ϵ∞, plasma frequency, ωp, and hole effective mass, mh∗, were evaluated as ϵ∞ = 7.59, ωp = 1.47 × 1014 and mh∗ = 1.25 m0.
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