Effect of Cu Concentration on Optical Properties of Zn1-xCuxO Thin Films

王存勇,周智涛,王峰,刘昌龙,龚万兵,吕建国,刘峰,黄凯
DOI: https://doi.org/10.16552/j.cnki.issn1001-1625.2013.11.001
2013-01-01
Abstract:CuxZn1-xO thin films were deposited using sol-gel method. Microstructure, surface topography,transmittance and photoluminescence spectrum were investigated by X-ray diffractometry,atomic force microscopy,ultraviolet-visible spectrophotometer and fluorescence spectrometer. The results show that all the thin films are polycrystalline,showing the wurtzite ZnO hexagonal structure. With the increasing of Cu concentration,average grain size increases first and then decreases,surface RMS roughness decreases first and then increases,and the absorption band-edge blue-shifts. The average transmittance of all the thin films in the visible range is about 80%. A weaker violet emission band and a stronger green emission band have been observed in the PL spectrum of undoped ZnO thin film. A violet emission band and a blue emission band have been observed in the other PL spectra. The violet emission is due to the electrons transition from the localized levels below conduction band to the valance band. The green emissions may be attributed to the electrons transition from oxygen vacancy levels to the valance band.
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