Abstract:In various fields of electronics, especially in telecommunication fields, microwave passive devices such as filters using high Tc superconductor (HTS) thin films are being developed and are undergoing on-site testing. Superconductor materials for applications of microwave resonators, filters, antenna and delay lines have the advantage of very low loss characteristics. Knowledge of this parameter is of primary importance for the development of a new material. For the typical reason of mechanics, various characterization technique have been developed to measure these properties, and each has its own advantages. For individual method, has some requires for the films, such as the dimension of the specimen under test. Sometime the really effective area is only a part of the whole area. In this article, we discussed the practical utilized area of a specimen of international standard on electronic characteristic measurements–surface resistance of superconductors at microwave frequencies. We designed the measurement apparatus for RS and measured the specimens. Both 2 inch specimen and 3 inch specimen are measured. We discussed the insertion loss for different diameter specimens. Some methods of measurements–surface resistance for different diameter specimens have been suggested. Also, we suggested the design procedures of dielectric resonator for the purpose of measuring high Tc superconductor (HTS) thin films surface resistance in different size samples.

Homogeneity Measurement of J(C) of Large-Scale High T-C Thin Films

A TE/sub 011+δ/ Mode Sapphire Resonator Probe for Accurate Characterization of Microwave Surface Resistance of HTS Thin Films

Measurement of the Transition Temperature Distribution and Magnetic Field Profile of Large Superconducting Films

Simple test for high Jc and low Rs superconducting thin films

Examination and Analysis of Critical Current Uniformity of Long HTS Tapes by the MCorder

Effective Measuring Position of Hall Probe and $j_\mathrm{c}$ Characterization of Rectangular HTS Thin Films

Spatial Variation of the Critical Current Density of the High T C Superconducting Thin Films

Studies of the Anomaly of Hall-Coefficient in High-Tc Superconducting Thin-Films

Continuous Critical Current Measurement of High-Temperature Superconductor Tapes with Magnetic Substrates Using Magnetic-Circuit Method.

MEASUREMENT OF THE SURFACE RESISTANCE OF HTS FILMS BY TWO DIELECTRIC RESONATORS METHOD

Square Helmholtz coil with homogeneous field for magnetic measurement of longer HTS tapes

The Electron-Beam Irradiation on the High Temperature Superconducting Thin Films

Controllable Growth and Magneto-Resistivity Investigations on Tl-1223 Superconducting Films with High Tc

A Method for Continuous Measurement of Critical Current of HTS Tapes Using Magnetic Circuits

Hall effect studies of the mixed state of c-axis oriented Hg0.9Tl0.1Ba2Ca2Cu3O8+δ superconducting films with Tc > 124K

Research on Effective Area of Surface Resistance Measurement of Superconducting Thin Film at Microwave Frequencies

The Critical Current Density Distribution in a TlBaCaCuO Thin Film Ring Resonator

Contactless Measurement of Critical Current of High Temperature Superconductor Tape by Magnetic Circuit.

Method and Apparatus for Continuous $i_{\rm C}$ Examination of HTS Tape Using Magnetic Circuit

Homogeneous superconducting phase in TiN film : a complex impedance study

Two-dimensional scaling of resistance in flux flow region in Tl2Ba2CaCu2O8 thin films