Abstract:Recent progress in high-temperature superconducting (HTS) applications, especially the success of compact Tokamak magnets, has brought great opportunity for HTS coated conductors (CCs). The present methods for measuring the critical current of CCs, including both dc transport measurements and inductive measurements, cannot fully satisfy the requirements of material manufacturers. We have formerly proposed a pulsed current inductive (PCI) method to solve this issue, which is different from the traditional pulsed current measurement since no voltage contact is required. The signal voltage is picked up by a coil placed near the sample. The other difference is that the PCI method utilizes one ramping pulse instead of a series of flat-top pulses. The PCI method does not suffer from inductive voltage interference. It is also fast due to the one pulse feature. The heat generation during the test is even smaller than that in the normal pulsed method. The PCI method is a fast, data-robust, and sample-safe transport measurement. In this article, the influences of the test conditions, including the coil displacement, coil shape, fluctuation of the tape $n$ value, and tape width, were analyzed, where $n$ refers to the $E$ – $J$ power law exponent of the superconducting tape. An apparatus for reel-to-reel critical current measurement of HTS tapes was constructed based on the PCI method. An 11-m tape was tested with a relatively high resolution of 18.5 mm and a speed of 0.3 m/min, which can be upgraded with multiple sensors. The combined uncertainty of the method was estimated to be 4% + 5 A. Short sample experiments showed that the relative deviation of the PCI method from the dc transport method was mostly less than 5%, without the introduction of any fitting parameters. A good step toward real application of the PCI method has been achieved in this work. The need to systematically study the influence of sample inhomogeneity in the future is also shown.

Homogeneity measurement of Jc of large-scale high Tc thin films

A TE/sub 011+δ/ Mode Sapphire Resonator Probe for Accurate Characterization of Microwave Surface Resistance of HTS Thin Films

Measurement of the Transition Temperature Distribution and Magnetic Field Profile of Large Superconducting Films

Simple test for high Jc and low Rs superconducting thin films

Examination and Analysis of Critical Current Uniformity of Long HTS Tapes by the MCorder

Effective Measuring Position of Hall Probe and $j_\mathrm{c}$ Characterization of Rectangular HTS Thin Films

Growth and Property Analysis of Large-Area Epitaxial Tl-2212 High Temperature Superconducting Films

Spatial Variation of the Critical Current Density of the High T C Superconducting Thin Films

Studies of the Anomaly of Hall-Coefficient in High-Tc Superconducting Thin-Films

A Pulsed Current Inductive Method and Its Applications for Continuous Measurement of the Critical Current of Long Superconducting Tapes.

Continuous Critical Current Measurement of High-Temperature Superconductor Tapes with Magnetic Substrates Using Magnetic-Circuit Method.

MEASUREMENT OF THE SURFACE RESISTANCE OF HTS FILMS BY TWO DIELECTRIC RESONATORS METHOD

Interrelated testing of JC and microwave nonlinearity in HTS film

Square Helmholtz coil with homogeneous field for magnetic measurement of longer HTS tapes

An Efficient and Accurate Method for HTS Surface Resistance Measurement

A Novel Method for the Measurement of Frequency Character of Surface Resistance of HTS Thin Film

The Electron-Beam Irradiation on the High Temperature Superconducting Thin Films

Controllable Growth and Magneto-Resistivity Investigations on Tl-1223 Superconducting Films with High Tc

Characterizing the Distribution of Microwave Surface Resistance of HTS Film Based on Metal Ring

A Method for Continuous Measurement of Critical Current of HTS Tapes Using Magnetic Circuits

Hall effect studies of the mixed state of c-axis oriented Hg0.9Tl0.1Ba2Ca2Cu3O8+δ superconducting films with Tc > 124K