Bright Field Structural Colors in Silicon-on-Insulator Nanostructures
Longjie Li,Jiebin Niu,Xiao Shang,Shengqiong Chen,Cheng Lu,Yongliang Zhang,Lina Shi
DOI: https://doi.org/10.1021/acsami.0c19126
2021-01-04
Abstract:Structural coloration with artificially nanostructured materials is emerging as a prospective alternative to traditional pigments for the high resolution, sustainable recycling, and long-time durability. However, achieving bright field structural colors with dielectric nanostructures remains a great challenge due to the weak scattering in an asymmetric environment. Here, we demonstrate all-dielectric bright field structural colors with diffraction-limited resolution on the silicon-on-insulator platform. The backscattering is strongly enhanced from the constructive interference between Mie resonances of individual Si antennas and Fabry–Perot resonances supported by the SiO<sub>2</sub> layer. The fabricated colors with varying hues and saturations show strong insensitivity with respect to the interparticle spacing and, remarkably, the viewing angle under resonant conditions. Compared with creating a quasi-homogeneous environment, our strategy is solid and complementary metal–oxide semiconductor integrable, paving the way for practical applications of structural colors in nanoscale color printing, microdisplays, and imaging.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsami.0c19126?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsami.0c19126</a>.Calculated backscattering spectra of a Si nanodisk on the SOI substrate. Reflectance spectra of a quartz substrate and SOI without the top layer Si. Reflectance of SOI without the top layer Si. Calculated backscattering spectra of a Si nanodisk on SOI substrates with different FP cavity lengths. Optical constants of top layer Si of the SOI. Reflectance spectra of Si nanodisk arrays with different periods. Optical property of the systems with and without a refractive index matching superstrate. Reflectance of the SOI substrate without a top layer Si and with 970 and 390 nm thick SiO<sub>2</sub> layers. Color palette and the optical characteristic of Si nanodisk arrays on the SOI substrate with 390 nm thick SiO<sub>2</sub> layer. Images with different pixel sizes. Image parameters (<a class="ext-link" href="/doi/suppl/10.1021/acsami.0c19126/suppl_file/am0c19126_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,nanoscience & nanotechnology