Optical Properties of AlxGa1-xAs/GaAs MQW Studied by Infrared Ellipsometry and Fourier Transform Infrared Spectroscopy

HX ZHU,MQ CHEN,JS LUO,KL WANG
DOI: https://doi.org/10.1006/spmi.1993.1032
IF: 3.22
1993-01-01
Superlattices and Microstructures
Abstract:The optical response of AlxGa1-xAs/GaAs MQW from near-infrared to far-infrared has been studied. Using infrared spectroscopic ellipsometry, we measured the optical response of the samples in the energy range 0.5-2.0eV, and oscillations have been observed. A multilayer film calculation indicates that this phenomenon results from interference. By Fourier transform infrared spectroscopy, the absorptance of double-well MQW has been measured in the energy range 0.08-0.25eV. The energy levels of subbands and the oscillator strengths were calculated from self-consistent interface potential theory. The calculation results are consistent with the measurements.
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