Abstract:The effect of a thin film of copper-phthalocyanine (CuPc), inserted between the indium tin oxide (ITO) and hole-transport layer N,N'-di(naphthalene-1-yl)N,N'-diphenyl-benzidine (NPB), on the hole injection in the multilayer light-emitting device of ITO/CuPc/NPB/ Alq(3)/LiF/Al and the hole-only-injected device of ITO/CuPc/NPB/Al was studied. The CuPc thickness dependence of the current-voltage characteristics clearly indicated that the insertion of CuPc enhanced the hole injection in a controllable manner. The enhancement is due to the different injection mechanisms at the interfaces of ITO/NPB and CuPc/NPB, which leads to the change of the distribution of the internal electric field in NPB. The mechanism of the hole injection at the ITO/NPB interface was proven to Richardson-Schottkey (RS) behavior, whereas Fowler-Nordheim (FN) tunneling occurred at the ITO/CuPc/NPB interface. From the multilayer light-emitting devices, it can be found that the thickness of CuPc shows significant effect on the electroluminescent (EL) efficiency and the operation voltage. The EL efficiency and brightness increase with increasing the CuPc thickness, and then decrease as the thickness of CuPc is further increased. We attributed the results to the change of the charge distribution in NPB layer due to the change of CuPc thickness.

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