Measurement of the wave-length of Compton scattering using X-ray diffraction apparatus

WANG He-ying,SUN Wen-bo,CHEN Yi-bao

DOI: https://doi.org/10.3969/j.issn.1000-0712.2007.12.011

2007-01-01

Abstract:Experimental methods and results of measuring wave-length of Compton scattering by powder X ray diffraction apparatus are described in detail.

What problem does this paper attempt to address?

Measuremens of the Compton scattering with γ-ray

CHEN Xing,LI Jian-long,HAN Wen-qi,CAO Si-yan

DOI: https://doi.org/10.3969/j.issn.1005-4642.2006.06.009

2006-01-01

Abstract:γ-ray Compton scattering from different materials are observed with incident photon energy of 661.67 keV to see if multi-electrons can be scattered by the same γ-ray photon at the same time. The electron mass is measured, and the linewidth of the coherent scattering is analyzed. By measuring the incoherent scattering photon energy,the incoherent scattering differential cross-section can be calculated.
Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Hui Xue,Weidong Shen,Peifu Gu,Zhenyue Luo,Yueguang Zhang,Xu Liu

DOI: https://doi.org/10.3788/col20090705.0446

2009-01-01

Abstract:A novel method to measure the absolute phase shift oil reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function phi, which is induced by three parts: the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter T(eff) and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference (OPD) is linearly dependent on the refractive index of the beam splitter to determine both L and T(eff). The spectral phase shift oil reflection of thin film structure can be obtained by subtracting these two parts from phi. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.
Bunch Length Measurement at Tsinghua Thomson Scattering X-ray Source

Du Ying-Chao,Hua Jian-Fei,Yan Li-Xin,Du Qiang,Huang Wen-Hui,Tang Chuan-Xiang

DOI: https://doi.org/10.1088/1674-1137/35/5/020

2011-01-01

Abstract:The length of electron beam from a photocathode RF gun is determined by a spectrometer, according to the relative energy spread induced by the bunch length during the acceleration in a linac. For a photocathode RF gun, different laser injected phase and beam charge are studied. The compression is changed for the different laser phases, as from 10 ° to 30 ° , and the bunch length is lengthened due to the strong longitudinal space charge force, caused by the increased charge.
The Discussion on Compton Scattering for Workpiece Inspection

REN Da-hai,YOU Zheng,WANG Xue-min,HAN Jian-xin,YE Sheng-hua

DOI: https://doi.org/10.3321/j.issn:1005-0086.2000.05.018

2000-01-01

Abstract:The research is carried out for a new non-destructive testing technique,that is the Compton scattering inspection.At f irst,the practical significance and the present development are investigated.Bas ed on the mathematical model of Compton scattering inspection and for the practi cal use of this technique,the inspection system is analyzed in view of structure design.Consequently,the optimizing design for system parameters is presented to improve the resolution of the system.Moreover,the problem to improve the effici ency of Compton scattering inspection is discussed.
Elements of X-Ray Physics and Crystallography

Shih-Lin Chang

DOI: https://doi.org/10.1007/978-3-662-10984-7_2

2004-01-01

Abstract:X-ray multiple-wave diffraction, like the usual two-wave Bragg diffraction, is an interference phenomenon between X-rays and a periodic crystal lattice. The detection of this phenomenon relies on the conditions of carrying out the diffraction experiments, which often involve X-ray sources and crystals. In this chapter, the experimental aspects of the currently available X-ray sources are described. The fundamentals of crystallography concerning reciprocal lattice and the factors affecting intensity measurements are briefly reviewed as well. The latter include the structure factor, absorption coefficient, Lorentz-polarization factor due to crystal rotation and the beam polarization. Other inelastic processes associated with X-ray diffraction like absorption and fluorescence are also mentioned.
Experimental Study on Soft X-Ray Diffraction of a Two-Dimensional Array

Xiangdong Xu,Yiling Hong,Tonglin Huo,Shiping Jiang,Xiaobing Shan,Shaoguang Yang,Shaojun Fu

DOI: https://doi.org/10.3321/j.issn:0253-2239.2000.09.018

2000-01-01

Abstract:The experiment of soft X-ray diffraction was carried out with synchrotron radiation to a two-dimensional array. Some images, which correspond to 0, 2 mm and 80 mm separation behind the specimen, were recorded as a relief pattern on photoresist by the use of 3.2 nm X-ray from U-12A bending magnet at national Synchrotron Radiation Laboratory. The processed photoresists were enlarged with an optical microscope. The experimental results show that patterns vary with the distance between specimen and photoresist detector, which are in good agreement with the theoretical results.
Experimental Characterization of Sub-picosecond Electron Bunch Length with Coherent Diffraction Radiation

Xiang Dao,Yang Xing-Fan,Huang Wen-Hui,Tang Chuan-Xiang,Lin Yu-Zheng,Li Wei-Hua,Pan Qing,Li Ming

DOI: https://doi.org/10.1088/0256-307x/25/7/030

2008-01-01

Chinese Physics Letters

Abstract:Diffraction radiation is one of the most promising candidates for electron beam diagnostics for the International Linear Collider, x-ray free electron lasers and energy recovery linac due to its non-intercepting characteristics. We report the non-intercepting measurement of sub-ps electron bunch length with coherent diffraction radiation. The bunch length is measured with a Martin-Puplett interferometer and the detailed longitudinal bunch shape is reconstructed with the Kramers-Kronig relation. The rms bunch length is found to be about 0.73 ps, which confirms a successful commissioning of the bunch compressor and the interferometer.
Extracting the electronic structure of light elements in bulk materials through a Compton scattering method in the readily accessible hard x-ray regime

Veenavee Nipunika Kothalawala,Tejas Guruswamy,Orlando Quaranta,Umeshkumar Manibhai Patel,Lisa Gades,Keith Taddei,Andrey Yakovenko,Meiying Zheng,Kelsey Morgan,Joel Weber,Daikang Yan,Daniel Swetz,Ilja Makkonen,Hemantha Kumar Yeddu,Arun Bansil,Uta Ruett,Antonino Miceli,Johannes Nokelainen,Bernardo Barbiellini

DOI: https://doi.org/10.1063/5.0207375

IF: 4

2024-05-27

Applied Physics Letters

Abstract:Our Compton profile measurements of Ti and TiH2 using readily available hard X-ray radiation at 27.5 keV, detected by both a Hitachi Vortex silicon-drift detector and a high-resolution superconducting transition-edge sensor array, are found to be in excellent accord with state-of-the-art density functional theory based calculations. The spherically averaged difference between the Compton profiles of TiH2 and Ti is well described by an inverted parabola, supporting an itinerant behavior of the electron gas screening the protons in the Ti matrix. Our experimental approach, validated by two different detectors, extends the applicability of Compton scattering technique to the readily accessible hard x-ray regime (below 30 keV). Our study suggests possibilities for experiments at low-flux bending magnet synchrotron beamlines and paves the way for the development of tabletop Compton experiments with x-ray tubes.

physics, applied
Ponderomotive Scattering of Electrons and Its Application to Measure the Pulse Duration of Ultrafast Electron Beams

Yunquan Liu,Jie Zhang,Huichun Wu,Zhengming Sheng

DOI: https://doi.org/10.1063/1.2840056

IF: 2.877

2008-01-01

Journal of Applied Physics

Abstract:We numerically study the relativistic ponderomotive scattering of an ultrafast electron beam with a focused high-intensity laser pulse using a three-dimensional test-particle code. The temporal evolution of the spatial distribution and the energy spectrum of the scattered electron beam are investigated. The method using the ponderomotive scattering effect to measure the pulse duration of an ultrashort electron beam is discussed in detail. Taking into account the group velocity mismatch, the interaction geometry, and electron energy spectrum modified by the ponderomotive forces, the pulse duration of ultrashort electron beams can be retrieved by the ponderomotive scattering cross-correlation method.
Measurements of an Effective Longitudinal Coherence Length in Transmission Small Angle X-ray Scatterings

Chun-Ting Liu,Bo-Ching He,Guo-Dung Chen,Alice Chinghsuan Chang,Wen-Li Wu,Wei-En Fu

DOI: https://doi.org/10.3390/nano10081549

IF: 5.3

2020-08-07

Nanomaterials

Abstract:The notion of an effective longitudinal coherence length with its value much greater than λ2/(2Δλ) has been adopted in small-angle X-ray scattering communities for years, where λ and Δλ denote the incident wavelength and its spread, respectively. Often the implications of the effective longitudinal coherence length do not even enter considerations in the designing and data treatment of small-angle scattering experiments. In this work, conventional transmission small-angle X-ray scattering (tSAXS) was performed to reveal a clear angular dependence on effective longitudinal coherence length. The measured values of effective longitudinal coherence length can be as high as one millimeter, whereas the value of calculated λ2/(2Δλ) is in nanometers.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry
Preliminary Experiments of Thomson Scattering X-Ray Source:Measurements of Electron Beam's Parameters and Their Influence on the X-Ray Performance

YC Du,WH Huang,CX Tang,JF Hua,C Cheng,TB Du,B Xia,XZ He,Q Du,SX Zheng,HB Chen,YZ Lin

DOI: https://doi.org/10.3321/j.issn:0254-3052.2006.z1.027

IF: 2.944

2006-01-01

Chinese Physics C

Abstract:In order to study the X-ray's parameters produced by Thomson scattering, the beam profile, energy, divergence and emittance of the 16MeV electron beam accelerated by the backward traveling wave electron linac are measured. The simulated results of the Thomson scattering X-ray based on the measured electron beam parameters are also presented.
Theoretical and simulation studies of characteristics of a Compton light source

Changchun Sun,Ying K. Wu

DOI: https://doi.org/10.1103/PhysRevSTAB.14.044701

2011-01-24

Abstract:Compton scattering of a laser beam with a relativistic electron beam has been used to generate intense, highly polarized and nearly monoenergetic x-ray or gamma-ray beams at many facilities. The ability to predict the spatial, spectral and temporal characteristics of a Compton gamma-ray beam is crucial for the optimization of the operation of a Compton light source as well as for the applications utilizing the Compton beam. In this paper, we present two approaches, one based upon analytical calculations and the other based upon Monte Carlo simulations, to study the Compton scattering process for various electron and laser beam parameters as well as different gamma-beam collimation conditions. These approaches have been successfully applied to characterize Compton gamma-ray beams, after being benchmarked against experimental results at the High Intensity Gamma-ray Source (HIGS) facility at Duke University.

Accelerator Physics
The application of second order diffraction of a monochrometer in laboratory exafs measurement

WANG WEN-CAI, YANG CHUN-LAI, CHEN YU,

DOI: https://doi.org/10.7498/aps.39.1684

IF: 0.906

1990-01-01

Acta Physica Sinica

Abstract:Some aspects on the application of second order diffraction of a monochrometer in laboratory EXAFS measurement are studied. Significant distortions in measured X-ray absorption fine structure occur when there are impurities' emission lines on the continuum spectra m the investigated energy range. A method for correcting that distortion is proposed. As the EXAFS amplitude decreases, which is caused by the application of second order diffraction of a monochrometer, how to obtain correct structural parameters is also discussed.
Physical properties of laser-electron Compton scattering

Ge Yu-Cheng

DOI: https://doi.org/10.7498/aps.58.3094

2009-01-01

Abstract:The energy properties and the differential cross-sections of laser-electron-Compton scattering are quantitatively investigated. The calculations show simple structures of the scattered photon energy and the angular distribution of the differential cross-section. At high incident electron energy, Compton scattering X-ray source has features of easily tunable photon energy and small forward emission angle. Although the dispersion of Compton scattering X-ray source is large, narrow bandwidth X-ray emission can be obtained experimentally by using specific monochromatic filter. The total cross-section and the cross-section within the forward emission angle (<1/γ, where γ= E/m 0c 2 is the total electron energy (E) in the unit of its static energy (m 0c 2)) change slightly for different laser wave lengths and different incident electron energies in a broad range from 1 MeV to 10 GeV. They have values of 0.067 mb and 0.033 mb, respectively. The total cross-section of the visible lights is very small. These results may be useful for building new generation ultra-short X-ray source based on Compton scattering technique. © 2009 Chin.Phys.Soc.
The Research on Defect Inspection Based on Compton Scattering

REN Da-hai,YOU Zheng,WANG Xue-min,HAN Jian-xin,YE Sheng-hua

DOI: https://doi.org/10.3321/j.issn:1005-0086.2000.03.025

2000-01-01

Abstract:A new non-destructive testing techn iq ue is investigated from the point of view of engineering application,that is the defect inspection in workpiece by Compton scattering.The significance of Compto n scattering for defect inspection is pointed out.The inspecting principle and t he mathematical model are analyzed.Meanwhile,the vacuum ionization chamber is em ployed for the primary experiment of Compton scattering inspection with the expe riment results analyzed.Moreover,the research emphasis and the applying outlook are pointed out.It is indicated through practice that the Compton scattering tec hnique processes the advantage of flexible structure and high sensitivity,which is unique predominance in some special cases.It goes without saying that it is v ery significant to carry out further research for application.
MEASUREMENT OF HEAVY PARTICLE MASS DISTRIBUTION IN COSMIC RAY AT SEA-LEVEL

D. R. Wang,C. J. Wang,X. L. Wang,D. W. Wang,N. Z. Liu,Y. S. Li,Z. P. Li,C. Z. Li,Z. G. Li,Jason Lin,Yan-Hao Xu,Y. B. Chen,Z. P. Chen,Rong Xu,J. W. Xi,Zhigang Yao,Hongxing Zhao,Yu Jiang,J. Lou,Y. Xie,J. Q. Zhang

1985-01-01

Abstract:The apparatus consisting of two time of flight systems and absorber and its performences are described. This apparatus has been used to measure heavy particle (p, d, t, and α) mass distribution in cosmic ray at sea-level, and the results compared with other works are given.
Static Properties of A Femtosecond Electron Diffraction System

Liu Yun-Quan,Liang Wen-Xi,Zhang Jie,Wu Jian-Jun,Tian Jin-Shou,Wang Jun-Feng,Zhao Bao-Sheng

DOI: https://doi.org/10.7498/aps.55.6500

IF: 0.906

2006-01-01

Acta Physica Sinica

Abstract:Ultrafast electron diffraction is an important technique to study the ultrafast phenomenon in physical, chemical and biological processes. This paper introduces a femtosecond electron diffractometer. The diameter of electron beam and deflection sensitivity of X-Y deflection plates are reported. We also demonstrate the static diffraction pattern of a 300 nm thick gold film taken by the femtosecond electron diffractometer.
High-resolution Compton spectroscopy using x-ray microcalorimeters

U. Patel,T. Guruswamy,A. J. Krzysko,H. Charalambous,L. Gades,K. Wiaderek,O. Quaranta,Y. Ren,A. Yakovenko,U. Ruett,A. Miceli

DOI: https://doi.org/10.1063/5.0092693

IF: 1.6

2022-11-15

Review of Scientific Instruments

Abstract:X-ray Compton spectroscopy is one of the few direct probes of the electron momentum distribution of bulk materials in ambient and operando environments. We report high-resolution inelastic x-ray scattering experiments with high momentum and energy transfer performed at a storage-ring-based high-energy x-ray light source facility using an x-ray transition-edge sensor (TES) microcalorimeter detector. The performance was compared with a silicon drift detector (SDD), an energy-resolving semiconductor detector, and Compton profiles were measured for lithium and cobalt oxide powders relevant to lithium-ion battery research. Spectroscopic analysis of the measured Compton profiles demonstrates the high-sensitivity to the low- Z elements and oxidation states. The line shape analysis of the measured Compton profiles in comparison with computed Hartree–Fock profiles is usually limited by the resolution of the semiconductor detector. We have characterized an x-ray TES microcalorimeter detector for high-resolution Compton scattering experiments using a bending magnet source at the Advanced Photon Source with a double crystal monochromator, providing monochromatic photon energies near 27.5 keV. The momentum resolution below 0.16 atomic units (a.u.) was measured, yielding an improvement of more than a factor of 7 over a state-of-the-art SDD for the same scattering geometry. Furthermore, the lineshapes of narrow valence and broad core electron profiles of sealed lithium metal were clearly resolved using an x-ray TES compared to smeared and broadened lineshapes observed when using the SDD. High-resolution Compton scattering using the energy-resolving area detector shown here presents new opportunities for spatial imaging of electron momentum distributions for a wide class of materials with applications ranging from electrochemistry to condensed matter physics.

instruments & instrumentation,physics, applied
X-ray scattering methods for films and multilayers and their applications

ZHANG Ai-Mei,WU Xiao-Shan

2007-01-01

Physics

Abstract:Several X-ray diffraction/scattering techniques, including grazing incident X-ray reflectivity, transverse X-ray diffuse scattering, grazing incident X-ray diffraction and X-ray small-angle diffraction, for the characterization of films and multilayers are described. Three examples are given to show the application of these methods.
Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility

Jia-Min Yang,Xin-Shi Gan,Yang Zhao,Ming-Qi Cui,Tuo Zhu,Yi-Dong Zhao,Li-Juan Sun,Lei Zheng,Fen Yan,Zhi-Min Hu,Min-Xi Wei,Ji-Yan Zhang,Rong-Qing Yi

DOI: https://doi.org/10.1088/1674-1056/20/1/010705

2011-01-01

Chinese Physics B

Abstract:Integral diffraction coefficients of the crystal are the essential data of a crystal spectrometer which is extensively used to measure quantitative x-ray spectra of high temperature plasmas in kilo-electron-volt region. An experimental method has been developed to measure the integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility. The integral diffraction coefficients of several crystals including polyethylene terephthalate (PET), thallium acid phthalate (TlAP) and rubidium acid phthalate (RAP) crystals have been measured in the x-ray energy range 2100–5600 eV and compared with the calculations of the ‘Darwin Prins’ and the ‘Mosaic’ models. It is shown that the integral diffraction coefficients of these crystals are between the calculations of the ‘Darwin Prins’ and the ‘Mosaic’ models, but more close to the ‘Darwin Prins’ model calculations.

physics, multidisciplinary

Measurement of the wave-length of Compton scattering using X-ray diffraction apparatus

Measuremens of the Compton scattering with γ-ray

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Bunch Length Measurement at Tsinghua Thomson Scattering X-ray Source

The Discussion on Compton Scattering for Workpiece Inspection

Elements of X-Ray Physics and Crystallography

Experimental Study on Soft X-Ray Diffraction of a Two-Dimensional Array

Experimental Characterization of Sub-picosecond Electron Bunch Length with Coherent Diffraction Radiation

Extracting the electronic structure of light elements in bulk materials through a Compton scattering method in the readily accessible hard x-ray regime

Ponderomotive Scattering of Electrons and Its Application to Measure the Pulse Duration of Ultrafast Electron Beams

Measurements of an Effective Longitudinal Coherence Length in Transmission Small Angle X-ray Scatterings

Preliminary Experiments of Thomson Scattering X-Ray Source:Measurements of Electron Beam's Parameters and Their Influence on the X-Ray Performance

Theoretical and simulation studies of characteristics of a Compton light source

The application of second order diffraction of a monochrometer in laboratory exafs measurement

Physical properties of laser-electron Compton scattering

The Research on Defect Inspection Based on Compton Scattering

MEASUREMENT OF HEAVY PARTICLE MASS DISTRIBUTION IN COSMIC RAY AT SEA-LEVEL

Static Properties of A Femtosecond Electron Diffraction System

High-resolution Compton spectroscopy using x-ray microcalorimeters

X-ray scattering methods for films and multilayers and their applications

Measurement of integral diffraction coefficients of crystals on beamline 4B7 of Beijing Synchrotron Radiation Facility