Extracting the electronic structure of light elements in bulk materials through a Compton scattering method in the readily accessible hard x-ray regime
Veenavee Nipunika Kothalawala,Tejas Guruswamy,Orlando Quaranta,Umeshkumar Manibhai Patel,Lisa Gades,Keith Taddei,Andrey Yakovenko,Meiying Zheng,Kelsey Morgan,Joel Weber,Daikang Yan,Daniel Swetz,Ilja Makkonen,Hemantha Kumar Yeddu,Arun Bansil,Uta Ruett,Antonino Miceli,Johannes Nokelainen,Bernardo Barbiellini
DOI: https://doi.org/10.1063/5.0207375
IF: 4
2024-05-27
Applied Physics Letters
Abstract:Our Compton profile measurements of Ti and TiH2 using readily available hard X-ray radiation at 27.5 keV, detected by both a Hitachi Vortex silicon-drift detector and a high-resolution superconducting transition-edge sensor array, are found to be in excellent accord with state-of-the-art density functional theory based calculations. The spherically averaged difference between the Compton profiles of TiH2 and Ti is well described by an inverted parabola, supporting an itinerant behavior of the electron gas screening the protons in the Ti matrix. Our experimental approach, validated by two different detectors, extends the applicability of Compton scattering technique to the readily accessible hard x-ray regime (below 30 keV). Our study suggests possibilities for experiments at low-flux bending magnet synchrotron beamlines and paves the way for the development of tabletop Compton experiments with x-ray tubes.
physics, applied