Static Properties of A Femtosecond Electron Diffraction System

Liu Yun-Quan,Liang Wen-Xi,Zhang Jie,Wu Jian-Jun,Tian Jin-Shou,Wang Jun-Feng,Zhao Bao-Sheng
DOI: https://doi.org/10.7498/aps.55.6500
IF: 0.906
2006-01-01
Acta Physica Sinica
Abstract:Ultrafast electron diffraction is an important technique to study the ultrafast phenomenon in physical, chemical and biological processes. This paper introduces a femtosecond electron diffractometer. The diameter of electron beam and deflection sensitivity of X-Y deflection plates are reported. We also demonstrate the static diffraction pattern of a 300 nm thick gold film taken by the femtosecond electron diffractometer.
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