Highly C-Axis Oriented LiNbO3 Thin Film Grown on SiO2/Si Substrates by Pulsed Laser Deposition

ZZ Ye,JH He,LF Ye,BH Zhao,WC Weng,HM Lu
DOI: https://doi.org/10.1016/s0167-577x(01)00658-9
IF: 3
2002-01-01
Materials Letters
Abstract:Highly c-axis oriented LiNbO3 thin film has been deposited on the SiO2/Si substrate by KrF excimer pulsed laser deposition (PLD) technique under optimized conditions of 30-Pa oxygen pressure and 600 °C substrate temperature. The amorphous SiO2 buffer layer was coated on the Si (001) wafer by thermal oxidation in situ. X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements confirm that the film shows superior crystalline quality and highly c-axis oriented texture. Neither the Li-enriched LiNbO3 target nor a biased electric field was applied during the deposition.
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