Comparison of the crystallization of Ge–Sb–Te and Si–Sb–Te in a constant-temperature annealing process

Ting Zhang,Yan Cheng,Zhitang Song,Bo Liu,Songlin Feng,Xiaodong Han,Ze Zhang,Bomy Chen
DOI: https://doi.org/10.1016/j.scriptamat.2008.01.048
IF: 6.302
2008-01-01
Scripta Materialia
Abstract:The crystallization of Ge-Sb-Te and Si-Sb-Te phase-change materials has been characterized by in situ time-dependent resistance measurement and transmission electron microscopy. Although silicon has various properties that are similar to those of germanium, Si-Sb-Te and Ge-Sb-Te crystallize via different processes. Si-Sb-Te has a complex structure (mainly hexagonal) while Ge-Sb-Te has a simple face-centered cubic structure when annealed at 433 K for several hours. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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