Abstract:Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant stress level between successive changes. This approach accelerates the occurrence of failures, reducing experimental duration and cost. While many studies assume a specific form for the lifetime distribution, in certain applications instead a general form satisfying certain properties should be preferred. Proportional hazard model assumes that applied stresses act multiplicatively on the hazard rate, so the hazards function may be divided into two factors, with one representing the effect of the stress, and the other representing the baseline hazard. In this work we examine two particular forms of baseline hazards, namely, linear and quadratic. Moreover, certain experiments may face practical constraints making continuous monitoring of devices infeasible. Instead, devices under test are inspected at predetermined intervals, leading to interval-censoring data. On the other hand, recent works have shown an appealing trade-off between the efficiency and robustness of divergence-based estimators. This paper introduces the step-stress ALT model under proportional hazards and presents a robust family of minimum density power divergence estimators (MDPDEs) for estimating device reliability and related lifetime characteristics such as mean lifetime and distributional quantiles. The asymptotic distributions of these estimates are derived, providing approximate confidence intervals. Empirical evaluations through Monte Carlo simulations demonstrate their performance in terms of robustness and efficiency. Finally, an illustrative example is provided to demonstrate the usefulness of the model and associated methods developed.

Analyzing Step-Stress Accelerated Life Testing Data Using Generalized Linear Models

A semiparametric approach for simple step-stress model

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Inferences for Exponentiated Gamma Constant-Stress Partially Accelerated Life Test Model Based on Generalized Type-I Hybrid Censored Data

Minimum Mean Square Error Estimators for the Exponential SSALT Model

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Advances in Accelerated Life Tests With Step and Varying Stress

Statistics Analysis for the Circular-Progressive-stress Life Tests under Generalized Exponential Distribution

Analysis for constant-stress model on multicomponent system from generalized inverted exponential distribution with stress dependent parameters

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Inference on exponentiated Rayleigh distribution with constant stress partially accelerated life tests under progressive type-II censoring

Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring

Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test

Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring

Bayesian Methods for Step-Stress Accelerated Test under Gamma Distribution with a Useful Reparametrization and an Industrial Data Application

Single and Multiple Ramp Progressive Stress with Binomial Removal: Practical Application for Industry

Bivariate step-stress accelerated life test for a new three-parameter model under progressive censored schemes with application in medical

Robust inference for an interval-monitored step-stress experiment under proportional hazards

Utilizing Bayesian inference in accelerated testing models under constant stress via ordered ranked set sampling and hybrid censoring with practical validation

Optimal Design of Reliability Acceptance Sampling Plan Based on Data Obtained from Partially Accelerated Life Test (PALT)

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process