Abstract:The reliability requirements for mechatronics continue to increase. Traditional life test methods make it difficult to obtain the data required to assess or predict the reliability of these mechatronic products within a reasonable time. Accelerated life tests can speed up the failure process of the product by using accelerated stress conditions. And then test data is obtained to predict the reliable life of the product under normal service conditions through modeling and analysis. The test efficiency of the accelerated life tests is higher than that of the life test. So, the method of accelerated life tests has become a solution for life and reliability prediction of highly reliable and long‐life mechatronic products. However, mechatronic products usually undergo cyclic stress during service. The use of cyclic stress as an accelerating stress in accelerated life tests can provide a realistic representation of service conditions and achieve higher test efficiency. Cyclic stress accelerated life test is an accurate and efficient solution for predicting the life and reliability of such mechatronic products. Current relative research is focused on constant stress, step stress and sequential stress accelerated life tests. A great challenge in engineering is modeling and analysis of cyclic stresses accelerated life tests. In this paper, we first describe the cyclic stress accelerated life test profile and its key parameters, then propose model assumptions and establish a modelling and analysis method for cyclic stress accelerated life test data, followed by an illustrative example to apply and validate the proposed method. The research results can provide technical support for the life and reliability assessment of mechatronic products under cyclic stress service conditions.

Advances in Accelerated Life Tests With Step and Varying Stress

Statistical Analysis of Inverse Weibull Constant-Stress Partially Accelerated Life Tests with Adaptive Progressively Type I Censored Data

Single and Multiple Ramp Progressive Stress with Binomial Removal: Practical Application for Industry

Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

A literature review on planning and analysis of accelerated testing for reliability assessment

Experimental designs for accelerated degradation tests based on linear mixed effects models

Optimal design for step-stress accelerated degradation testing with competing failure modes

Tampered Random Variable Analysis in Step-Stress Testing: Modeling, Inference, and Applications

Optimal Stress Levels in Accelerated Degradation Testing for Various Degradation Models

Joint Modeling of Linear Degradation and Multiple Dependent Competing Risks Data under a Step-Stress Accelerated Degradation Test

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test

Cyclic stress accelerated life test method for mechatronic products

A semiparametric approach for simple step-stress model

Bayesian Methods for Step-Stress Accelerated Test under Gamma Distribution with a Useful Reparametrization and an Industrial Data Application

Design Technology of Accelerated Life Test Based on the Load Spectrum Compilation and D-efficiency

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Accelerated Life Testing (ALT) Design Based on Computational Reliability Analysis

Design of statistically and energy-efficient accelerated life testing experiments

Acceptance sampling plans based on failure‐censored step‐stress accelerated tests for Weibull distributions