Preparation and Investigation of Hydrophobic Mesoporous Silica Films

WU Zhaofeng,WU Guangming,YAO Lanfang,LIU Feng
DOI: https://doi.org/10.3321/j.issn:1005-023X.2005.03.031
2005-01-01
Abstract:A novel route to prepare mesoporous SiO_2 films is reported in this paper.FTIR,XRD and AFM are used to characterize the films.The refractive index and dielectric constant are measured by Ellipsometer and impedance analysis apparatus.The films with low dielectric constant and good mechanical properties can be acquired by adjusting the concentration of CTAB and aging time.
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