Progress and research at the Shanghai EBIT

W. Hu,Y. Fu,P. Gong,K. Yao,D. Lu,W. Chen,Y. Liu,Y. Yang,J. Xiao,S. Wu,Z. Geng,M. Huang,X. Zhang,R. Hutton,L. Liljeby,M. He,Y. Zou
DOI: https://doi.org/10.1139/P07-161
2008-01-01
Canadian Journal of Physics
Abstract:In this report, a brief description of the current progress at the Shanghai EBIT project is presented. This is followed by a short discussion of the measurement of various parameters (electron beam diameter and ion density) under a number of operational conditions. A brief introduction to di-electronic recombination measurements for highly ionized xenon is given. Next, we present a preliminary measurement of the time dependence of xenon X-ray emission lines. Finally, a comparison of calculated and experimental charge-state distributions is given. This shows the influence of multi-electron capture and different distributions of the ion cloud on the charge state distribution.
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