Overview of the Shanghai EBIT

Y. Fu,K. Yao,B. Wei,D. Lu,R. Hutton,Y. Zou
DOI: https://doi.org/10.1088/1748-0221/5/08/c08011
2010-01-01
Journal of Instrumentation
Abstract:EBIT (Electron Beam Ion Trap) is an excellent instrument both as light source and ion source, and is widely used in atomic physics research. In principle EBITs can produce ions of any charge state and of any element. In this report, a general introduction to the Shangai EBIT and short discussions of the spectroscopy platform are presented. Due to the repetitious running of the Shanghai EBIT over the past 5 years, it became necessary for the Shanghai EBIT to be disassembled for some maintenances and further modifications/improvements. The new design contains two major improvements. Furthermore, some experimental results on studies of dielectronic recombination processes for highly charged Xe ions will be discussed.
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