The Potential of an EBIT in Assisting Plasma Diagnostics and Progress at the Shanghai EBIT

Y Zou,R Hutton
DOI: https://doi.org/10.1088/1742-6596/185/1/012060
2009-01-01
Journal of Physics Conference Series
Abstract:In this paper, the potential of Electron Beam Ion Traps (EBIT) in assisting plasma diagnostics is reviewed. Examples of how EBITs have contributed to plasma diagnostic studies, including both magnetic fusion and inertial fusion plasmas, are shown. The progress of the instrumentation development at the Shanghai EBIT and ongoing research in the Shanghai EBIT laboratory are reported.
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