Abstract:It is difficult to control the microstructure of materials developed following the additive manufacturing (AM) process, and researchers have been trying to address this problem for a long time. Process parameters, such as the scanning strategy, significantly affect microstructural properties. Scanning strategies can be tuned to achieve control over the crystal texture of alloys. However, in-depth studies on the relationship between the scanning strategy and the deflection growth have not been conducted to date. Changes in the scanning angle result in changes in the direction of the temperature gradient associated with the molten pool, and this eventually affects the growth of grains. Herein, a new generalized method has been proposed to control the extent of deflection growth in grains realized. The results help determine the relationship between the scanning angle and the grain deflection growth in space. The LPBF-AM technology was used under conditions of varying scanning angles to fabricate Ni10Cr6W1Fe9Ti1, a single-phase (FCC) high-entropy alloy. The experimental results reveal that the angle corresponding to the deflection growth angle in space is approximately equal to the scanning angle. The extent of epitaxial growth in grains is low, and the amount of low-angle grain boundaries(GB) is high when the scanning angle is 67°. This can be attributed to the presence of small grains. The performance of the alloy was optimized, and it was observed that the performance of the prepared alloy was better than the performance recorded for previously reported alloys. The tensile strength, yield strength, and elongation post fracture were recorded to be 961.65 MPa, 739.77 MPa, and 26.5%, respectively. This report which states that the AM method can be used to fabricate single-phase (FCC) high-entropy alloys characterized by high strength and good ductility. The determination of the relationship between the scanning angle and the deflection growth of grains in space help provide a platform to achieve precise control over the microstructure of materials.

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