High-Quality Silicon Nitride CMOS Photonic Devices

Rakesh Krishna,Zhongdi Peng,Amir H. Hosseinnia,Ali Adibi
DOI: https://doi.org/10.1109/lpt.2024.3396622
IF: 2.6
2024-05-17
IEEE Photonics Technology Letters
Abstract:In this letter, high-quality silicon nitride (SiN) devices are demonstrated for the first time in a monolithic complementary-metal-oxide-semiconductor (CMOS) photonic platform with a hybrid silicon (Si)-SiN capability. Device demonstrations include a racetrack resonator with quality factor (Q) and a coupled resonator-based wavelength filter with an insertion loss of 1.78 dB and extinction ratio of 6.88 dB. Although high-quality SiN devices are demonstrated in multiple foundries, the ability to monolithically co-integrate these devices with Si-based detectors and other electronic circuits will enable a wide range of system-level applications requiring low loss, high Q, and low-thermal sensitivity in a wide range of wavelengths from visible to infrared.
engineering, electrical & electronic,optics,physics, applied
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