Transient positron annihilation spectroscopy under light irradiation at liquid nitrogen temperature: evaluation of defect states in single-crystal ZnO

Makoto Nakajima,Atsushi KINOMURA,Qiu Xu,Kazuo Kuriyama,Atsushi Kinomura
DOI: https://doi.org/10.35848/1347-4065/ad3007
IF: 1.5
2024-03-19
Japanese Journal of Applied Physics
Abstract:A time-dependent measurement system has been developed for positron annihilation spectroscopy to study the effects of light irradiation at liquid nitrogen temperature. The system enables the measurement of positron annihilation lifetimes after pulse light irradiation, utilizing various time windows to investigate the transient changes of photo-excited vacancy-type defects. Additionally, this system facilitates coincidence Doppler broadening measurements during light irradiation at liquid nitrogen temperature. The system was successfully employed to analyze changes in positron lifetime and positron annihilation sites in electron-irradiated single-crystalline ZnO under light irradiation.
physics, applied
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